Conesa Boj, S.; Estradé, S.; Rebled, J.M.; Prades, J.D.; Cirera, A.; Morante, J.R.; Peiró, P.; Arbiol, J "Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconstruction Models" Nanowires pp. 185 - 214. 2010